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Results: 2
STATISTICAL SIMULATION OF IC TECHNOLOGY - A BIPOLAR PROCESS EXAMPLE
Authors:
SANDERS TJ REKAB K CHUNG SH
Citation:
Tj. Sanders et al., STATISTICAL SIMULATION OF IC TECHNOLOGY - A BIPOLAR PROCESS EXAMPLE, Microelectronics and reliability, 36(9), 1996, pp. 1191-1205
A SAMPLING SCHEME FOR ESTIMATING THE RELIABILITY OF A SERIES SYSTEM
Authors:
REKAB K
Citation:
K. Rekab, A SAMPLING SCHEME FOR ESTIMATING THE RELIABILITY OF A SERIES SYSTEM, IEEE transactions on reliability, 42(2), 1993, pp. 287-290
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