Authors: SANDERS TJ REKAB K CHUNG SH

Citation: Tj. Sanders et al., STATISTICAL SIMULATION OF IC TECHNOLOGY - A BIPOLAR PROCESS EXAMPLE, Microelectronics and reliability, 36(9), 1996, pp. 1191-1205

Authors: REKAB K

Citation: K. Rekab, A SAMPLING SCHEME FOR ESTIMATING THE RELIABILITY OF A SERIES SYSTEM, IEEE transactions on reliability, 42(2), 1993, pp. 287-290