Authors: PREOBRASHENSKII MN REPIN VN KOZLOV VA KOSTINA LS

Citation: Mn. Preobrashenskii et al., RECEPTION OF ACOUSTIC IMAGES OF SEMICONDU CTING STRUCTURE INTERNAL LAYERS AT HIGH-FREQUENCIES, Pis'ma v Zurnal tehniceskoj fiziki, 22(9), 1996, pp. 45-50

Authors: VALIEV KA REPIN VN

Citation: Ka. Valiev et Vn. Repin, ACOUSTIC MICROSCOPY TECHNIQUES FOR THE IN VESTIGATION OF SEMICONDUCTOR STRUCTURES, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 58(7), 1994, pp. 129-133