Authors: MATHE EL NAUDON A REPPLINGER F FOGARASSY E

Citation: El. Mathe et al., MORPHOLOGY OF SI1-XGEX THIN CRYSTALLINE FILMS OBTAINED BY PULSED-EXCIMER-LASER ANNEALING OF HEAVILY GE-IMPLANTED SI, Applied surface science, 86(1-4), 1995, pp. 338-345

Authors: REPPLINGER F FOGARASSY E GROB A GROB JJ MULLER D PREVOT B STOQUERT JP DEUNAMUNO S

Citation: F. Repplinger et al., PREPARATION OF SI1-XGEX THIN CRYSTALLINE FILMS BY PULSED EXCIMER-LASER ANNEALING OF HEAVILY GE IMPLANTED SI, Thin solid films, 241(1-2), 1994, pp. 155-158

Authors: REPPLINGER F STOQUERT JP SIFFERT P

Citation: F. Repplinger et al., DOUBLE SCATTERING IN ELASTIC RECOIL SPECTRA, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 24-27