Authors: MATTSON MA MYERS TH RICHARDSBABB M MEYER JR

Citation: Ma. Mattson et al., EVALUATION OF LOW-TEMPERATURE INTERDIFFUSION COEFFICIENTS IN HG-BASEDSUPERLATTICES BY MONITORING THE E-1 REFLECTANCE PEAK, Journal of electronic materials, 26(6), 1997, pp. 578-583

Authors: YU ZH BUCZKOWSKI SL PETCU MC GILES NC MYERS TH RICHARDSBABB M

Citation: Zh. Yu et al., PHOTON-ASSISTED GROWTH OF NITROGEN-DOPED CDTE AND THE EFFECTS OF HYDROGEN INCORPORATION DURING GROWTH, Journal of electronic materials, 25(8), 1996, pp. 1247-1253

Authors: PARK KT RICHARDSBABB M HESS JS WEISS J KLIER K

Citation: Kt. Park et al., VALENCE-BAND ELECTRONIC-STRUCTURE OF MOS2 AND CS MOS2(0002) STUDIED BY ANGLE-RESOLVED X-RAY PHOTOEMISSION SPECTROSCOPY/, Physical review. B, Condensed matter, 54(8), 1996, pp. 5471-5479

Authors: PARK KT RICHARDSBABB M FREUND MS WEISS J KLIER K

Citation: Kt. Park et al., SURFACE-STRUCTURE OF SINGLE-CRYSTAL MOS2(0002) AND CS MOS2(0002) BY X-RAY PHOTOELECTRON DIFFRACTION/, Journal of physical chemistry, 100(25), 1996, pp. 10739-10745