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Results: 1-21 |
Results: 21
MICROSTRUCTURAL CHARACTERIZATION OF ION-ASSISTED SIO2 THIN-FILMS BY VISIBLE AND INFRARED ELLIPSOMETRY
Authors: BRUNETBRUNEAU A SOUCHE D FISSON S VAN VN VUYE G ABELES F RIVORY J
Citation: A. Brunetbruneau et al., MICROSTRUCTURAL CHARACTERIZATION OF ION-ASSISTED SIO2 THIN-FILMS BY VISIBLE AND INFRARED ELLIPSOMETRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(4), 1998, pp. 2281-2286
CHARACTERIZATION OF INHOMOGENEOUS DIELECTRIC FILMS BY SPECTROSCOPIC ELLIPSOMETRY
Authors: RIVORY J
Citation: J. Rivory, CHARACTERIZATION OF INHOMOGENEOUS DIELECTRIC FILMS BY SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 333-340
VISIBLE AND INFRARED ELLIPSOMETRY STUDY OF ION-ASSISTED SIO2-FILMS
Authors: SOUCHE D BRUNETBRUNEAU A FISSON S VAN VN VUYE G ABELES F RIVORY J
Citation: D. Souche et al., VISIBLE AND INFRARED ELLIPSOMETRY STUDY OF ION-ASSISTED SIO2-FILMS, Thin solid films, 313, 1998, pp. 676-681
CORRELATION BETWEEN MICROSTRUCTURE AND THE OPTICAL-PROPERTIES OF TIO2THIN-FILMS PREPARED ON DIFFERENT SUBSTRATES
Authors: LEPRINCEWANG Y YUZHANG K VAN VN SOUCHE D RIVORY J
Citation: Y. Leprincewang et al., CORRELATION BETWEEN MICROSTRUCTURE AND THE OPTICAL-PROPERTIES OF TIO2THIN-FILMS PREPARED ON DIFFERENT SUBSTRATES, Thin solid films, 307(1-2), 1997, pp. 38-42
INFRARED ELLIPSOMETRY STUDY OF EVAPORATED SIO2-FILMS - MATRIX DENSIFICATION, POROSITY, WATER SORPTION
Authors: BRUNETBRUNEAU A RIVORY J RAFIN B ROBIC JY CHATON P
Citation: A. Brunetbruneau et al., INFRARED ELLIPSOMETRY STUDY OF EVAPORATED SIO2-FILMS - MATRIX DENSIFICATION, POROSITY, WATER SORPTION, Journal of applied physics, 82(3), 1997, pp. 1330-1335
SPATIALLY-RESOLVED EELS FINE-STRUCTURES AT A SIO2 TIO2 INTERFACE/
Authors: BRUN N COLLIEX C RIVORY J YUZHANG K
Citation: N. Brun et al., SPATIALLY-RESOLVED EELS FINE-STRUCTURES AT A SIO2 TIO2 INTERFACE/, Microscopy microanalysis microstructures, 7(3), 1996, pp. 161-174
DETERMINATION OF REFRACTIVE-INDEX PROFILES BY A COMBINATION OF VISIBLE AND INFRARED ELLIPSOMETRY MEASUREMENTS
Authors: VAN VN BRUNETBRUNEAU A FISSON S FRIGERIO JM VUYE G WANG Y ABELES F RIVORY J BERGER M CHATON P
Citation: Vn. Van et al., DETERMINATION OF REFRACTIVE-INDEX PROFILES BY A COMBINATION OF VISIBLE AND INFRARED ELLIPSOMETRY MEASUREMENTS, Applied optics, 35(28), 1996, pp. 5540-5544
INFRARED ELLIPSOMETRY INVESTIGATION OF SIOXNY THIN-FILMS ON SILICON
Authors: BRUNETBRUNEAU A VUYE G FRIGERIO JM ABELES F RIVORY J BERGER M CHATON P
Citation: A. Brunetbruneau et al., INFRARED ELLIPSOMETRY INVESTIGATION OF SIOXNY THIN-FILMS ON SILICON, Applied optics, 35(25), 1996, pp. 4998-5004
INITIAL-STAGES IN THE FORMATION OF PTSI ON SI(111) AS FOLLOWED BY PHOTOEMISSION AND SPECTROSCOPIC ELLIPSOMETRY
Authors: LEY L WANG Y VAN VN FISSON S SOUCHE D VUYE G RIVORY J
Citation: L. Ley et al., INITIAL-STAGES IN THE FORMATION OF PTSI ON SI(111) AS FOLLOWED BY PHOTOEMISSION AND SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 270(1-2), 1995, pp. 561-566
SYNTHESIS OF OPTICAL MULTILAYER SYSTEMS USING GENETIC ALGORITHMS
Authors: MARTIN S RIVORY J SCHOENAUER M
Citation: S. Martin et al., SYNTHESIS OF OPTICAL MULTILAYER SYSTEMS USING GENETIC ALGORITHMS, Applied optics, 34(13), 1995, pp. 2247-2254
X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE GROWTH OF DIELECTRIC FILMS ON VARIOUS SUBSTRATES
Authors: WANG Y FISSON S VAN VN VUYE G YUZHANG K RIVORY J
Citation: Y. Wang et al., X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE GROWTH OF DIELECTRIC FILMS ON VARIOUS SUBSTRATES, Surface & coatings technology, 68, 1994, pp. 724-728
GROWTH OF LOW AND HIGH REFRACTIVE-INDEX DIELECTRIC LAYERS AS STUDIED BY IN-SITU ELLIPSOMETRY
Authors: VAN VN FISSON S FRIGERIO JM RIVORY J VUYE G WANG Y ABELES F
Citation: Vn. Van et al., GROWTH OF LOW AND HIGH REFRACTIVE-INDEX DIELECTRIC LAYERS AS STUDIED BY IN-SITU ELLIPSOMETRY, Thin solid films, 253(1-2), 1994, pp. 257-261
CHARACTERIZATION OF TIO2 SIO2 MULTILAYERS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY AND ELECTRON-ENERGY-LOSS SPECTROSCOPY/
Authors: YUZHANG K BOISJOLLY G RIVORY J KILIAN L COLLIEX C
Citation: K. Yuzhang et al., CHARACTERIZATION OF TIO2 SIO2 MULTILAYERS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY AND ELECTRON-ENERGY-LOSS SPECTROSCOPY/, Thin solid films, 253(1-2), 1994, pp. 299-302
SIMULATED DARWINIAN EVOLUTION OF HOMOGENEOUS MULTILAYER SYSTEMS - A NEW METHOD FOR OPTICAL COATINGS DESIGN
Authors: MARTIN S RIVORY J SCHOENAUER M
Citation: S. Martin et al., SIMULATED DARWINIAN EVOLUTION OF HOMOGENEOUS MULTILAYER SYSTEMS - A NEW METHOD FOR OPTICAL COATINGS DESIGN, Optics communications, 110(5-6), 1994, pp. 503-506
ENHANCEMENT AND QUENCHING OF BERREMAN POLARITONS IN SIO2 TIO2 AND AL2O3/PT SUPERLATTICES/
Authors: WOLD E BREMER J HUNDERI O FRIGERIO JM PARJADIS G RIVORY J
Citation: E. Wold et al., ENHANCEMENT AND QUENCHING OF BERREMAN POLARITONS IN SIO2 TIO2 AND AL2O3/PT SUPERLATTICES/, Journal of applied physics, 75(3), 1994, pp. 1739-1747
AMORPHOUS AND QUASI-CRYSTALLINE ALMN AND ALFE PHASE SYNTHESIS BY ION-BEAM MIXING AND RELATED TRANSPORT-PROPERTIES
Authors: PLENET JC PEREZ A RIVORY J LABORDE O
Citation: Jc. Plenet et al., AMORPHOUS AND QUASI-CRYSTALLINE ALMN AND ALFE PHASE SYNTHESIS BY ION-BEAM MIXING AND RELATED TRANSPORT-PROPERTIES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 379-385
MODELING OF ELLIPSOMETRIC DATA OF INHOMOGENEOUS TIO2 FILMS
Authors: DELARIVIERE GP FRIGERIO JM BRIDOU F RIVORY J
Citation: Gp. Delariviere et al., MODELING OF ELLIPSOMETRIC DATA OF INHOMOGENEOUS TIO2 FILMS, Thin solid films, 234(1-2), 1993, pp. 458-462
TEMPERATURE-DEPENDENCE OF THE DIELECTRIC FUNCTION OF SILICON USING IN-SITU SPECTROSCOPIC ELLIPSOMETRY
Authors: VUYE G FISSON S VAN VN WANG Y RIVORY J ABELES F
Citation: G. Vuye et al., TEMPERATURE-DEPENDENCE OF THE DIELECTRIC FUNCTION OF SILICON USING IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 166-170
STUDY OF CAF2 GROWTH ON SI, A-SIO2 BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY
Authors: RIVORY J FISSON S VAN VN VUYE G WANG Y ABELES F YUZHANG K
Citation: J. Rivory et al., STUDY OF CAF2 GROWTH ON SI, A-SIO2 BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 260-263
PROCEEDINGS OF THE 1ST INTERNATIONAL-CONFERENCE ON SPECTROSCOPIC ELLIPSOMETRY, PARIS, FRANCE, JANUARY 11-14, 1993 .1. PREFACE
Authors: BOCCARA AC PICKERING C RIVORY J
Citation: Ac. Boccara et al., PROCEEDINGS OF THE 1ST INTERNATIONAL-CONFERENCE ON SPECTROSCOPIC ELLIPSOMETRY, PARIS, FRANCE, JANUARY 11-14, 1993 .1. PREFACE, Thin solid films, 233(1-2), 1993, pp. 180000009-180000009
PHOTONIC BANDTAIL IN 1D RANDOMLY-PERTURBED PERIODIC-SYSTEMS
Authors: FRIGERIO JM RIVORY J SHENG P
Citation: Jm. Frigerio et al., PHOTONIC BANDTAIL IN 1D RANDOMLY-PERTURBED PERIODIC-SYSTEMS, Optics communications, 98(4-6), 1993, pp. 231-235
Risultati: 1-21 |