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Authors: OVERHAUSER D LLOYD JR ROCHEL S STEELE G HUSSAIN SZ
Citation: D. Overhauser et al., FULL-CHIP RELIABILITY-ANALYSIS, Microelectronics and reliability, 38(6-8), 1998, pp. 851-859

Authors: GROTELUSCHEN E GRABINSKI H ROCHEL S WINKEL TM
Citation: E. Groteluschen et al., LOSSYWIRE - A MODEL IMPLEMENTATION FOR TRANSIENT AND AC ANALYSIS OF LOSSY COUPLED TRANSMISSION-LINES IN THE CIRCUIT SIMULATOR ELDO(TM), AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, 49(1), 1995, pp. 37-43
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