FULL-CHIP RELIABILITY-ANALYSIS

Authors
OVERHAUSER D LLOYD JR ROCHEL S STEELE G HUSSAIN SZ
Citation
D. Overhauser et al., FULL-CHIP RELIABILITY-ANALYSIS, Microelectronics and reliability, 38(6-8), 1998, pp. 851-859
Citations number
12
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
38
Issue
6-8
Year of publication
1998
Pages
851 - 859
Database
ISI
SICI code
0026-2714(1998)38:6-8<851:FR>2.0.ZU;2-1
Abstract
Reliability analysis has not been promoted to the realm of full-chip b ecause techniques to extract, manage, and process full-chip power grid and signal data have not been previously available. This paper introd uces techniques that have been developed to permit both full-chip powe r grid and signal net electromigration and Joule heating analysis. Res ults of this analysis provide feedback to the designer to permit easy design modification to provide superior ''designed-in'' long-term reli ability. (C) 1998 Elsevier Science Ltd. All rights reserved.