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Results:
1-19
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Results: 19
Authors:
ROSELER A
KORTE EH
Citation: A. Roseler et Eh. Korte, SURFACE-ENHANCED INFRARED-ABSORPTION OBSERVED WITH ATTENUATED TOTAL-REFLECTION (ATR-SEIRA) - MODELING THE OPTICAL-RESPONSE, Fresenius' journal of analytical chemistry, 362(1), 1998, pp. 51-57
Authors:
ANGERMANN H
HENRION W
REBIEN M
FISCHER D
ZETTLER JT
ROSELER A
Citation: H. Angermann et al., H-TERMINATED SILICON - SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS CORRELATED TO THE SURFACE ELECTRONIC-PROPERTIES, Thin solid films, 313, 1998, pp. 552-556
Authors:
ROSELER A
KORTE EH
Citation: A. Roseler et Eh. Korte, INFRARED ELLIPSOMETRIC ANALYSIS OF ORGANIC FILM-ON-SUBSTRATE SAMPLES, Thin solid films, 313, 1998, pp. 708-712
Authors:
ROSELER A
KORTE EH
Citation: A. Roseler et Eh. Korte, THE OPTICAL-CONSTANTS OF METALLIC ISLAND FILMS AS USED FOR SURFACE-ENHANCED INFRARED-ABSORPTION, Thin solid films, 313, 1998, pp. 732-736
Authors:
KORTE EH
ROSELER A
Citation: Eh. Korte et A. Roseler, INFRARED SPECTROSCOPIC ELLIPSOMETRY - A TOOL FOR CHARACTERIZING NANOMETER LAYERS, Analyst, 123(4), 1998, pp. 647-651
Authors:
ANGERMANN H
HENRION W
REBIEN M
ZETTLER JT
ROSELER A
Citation: H. Angermann et al., CHARACTERIZATION OF CHEMICALLY PREPARED SI-SURFACES BY UV-VIS AND IR SPECTROSCOPIC ELLIPSOMETRY AND SURFACE PHOTOVOLTAGE, Surface science, 388(1-3), 1997, pp. 15-23
Authors:
ROSELER A
DIETEL R
KORTE EH
Citation: A. Roseler et al., CHARACTERIZING LANGMUIR-BLODGETT LAYERS BY INFRARED ELLIPSOMETRY, Mikrochimica acta, 1997, pp. 657-659
Authors:
DITTMAR G
ROSELER A
RICHTER U
WIELSCH U
Citation: G. Dittmar et al., SPECTROSCOPIC ELLIPSOMETRY IN THE MID INFRARED WITH A NEW ACCESSORY FITTING INTO STANDARD FOURIER-TRANSFORM SPECTROMETERS, Mikrochimica acta, 1997, pp. 763-765
Authors:
ROSELER A
KORTE EH
Citation: A. Roseler et Eh. Korte, INFRARED-OPTICAL CHARACTERIZATION OF METALLIC ISLAND FILMS, Applied spectroscopy, 51(6), 1997, pp. 902-904
Authors:
MARKWITZ A
BAUMANN H
GRILL W
HEINZ B
ROSELER A
KRIMMEL EF
BETHGE K
Citation: A. Markwitz et al., SURFACE-NEAR ANALYSES OF ULTRA-THIN SILICON-NITRIDE LAYERS BY NRA, CHANNELING RBS, FT IR ELLIPSOMETRY AND AFM, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 734-739
Authors:
MICHELMANN RW
BAUMANN H
MARKWITZ A
MEYER JD
ROSELER A
KRIMMEL EF
BETHGE K
Citation: Rw. Michelmann et al., COMBINED NRA, CHANNELING-RES AND FTIR ELLIPSOMETRY ANALYSES FOR THE DETERMINATION OF THE INTERFACE AND BONDING STATE OF THIN SIOX AND SINXOY LAYERS, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 403-407
Authors:
ROSELER A
KORTE EH
Citation: A. Roseler et Eh. Korte, ELLIPSOMETRIC ATR SPECTROSCOPY FOR MEASURING THE INFRARED REFRACTIVE-INDEX, Journal of molecular structure, 349, 1995, pp. 321-324
Authors:
ROSELER A
Citation: A. Roseler, SURFACE CHARACTERIZATION BY SPECTROSCOPIC INFRARED ELLIPSOMETRY, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 358-361
Authors:
ROSELER A
KORTE EH
REINS J
Citation: A. Roseler et al., APPLICATIONS OF PHOTOMETRIC ELLIPSOMETRY IN INFRARED-SPECTROSCOPY, Vibrational spectroscopy, 5(3), 1993, pp. 275-283
Authors:
ROSELER A
Citation: A. Roseler, IR SPECTROSCOPIC ELLIPSOMETRY - INSTRUMENTATION AND RESULTS, Thin solid films, 234(1-2), 1993, pp. 307-313
Authors:
HUMLICEK J
ROSELER A
Citation: J. Humlicek et A. Roseler, IR ELLIPSOMETRY OF THE HIGHLY ANISOTROPIC MATERIALS ALPHA-SIO2 AND ALPHA-AL2O3, Thin solid films, 234(1-2), 1993, pp. 332-336
Authors:
WEIDNER M
ROSELER A
EICHLER M
Citation: M. Weidner et al., IR ELLIPSOMETRY INVESTIGATIONS OF N2O-NITRIDED SILICON-OXIDE THIN-FILMS ON SILICON, Thin solid films, 234(1-2), 1993, pp. 337-341
Authors:
REINS J
KORTE EH
ROSELER A
Citation: J. Reins et al., IR SPECTROSCOPIC ELLIPSOMETRY - TRANSMISSION STUDIES ON LIQUID-CRYSTALS, Thin solid films, 234(1-2), 1993, pp. 486-490
Authors:
HUMLICEK J
KAMARAS K
KIRCHER J
HABERMEIER HU
CARDONA M
ROSELER A
STEHLE JL
Citation: J. Humlicek et al., MID-IR AND NEAR-IR ELLIPSOMETRY OF Y1-XPRXBA2CU3O7 EPITAXIAL-FILMS, Thin solid films, 234(1-2), 1993, pp. 518-521
Risultati:
1-19
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