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RESIST - A RECURSIVE TEST PATTERN GENERATION ALGORITHM FOR PATH DELAYFAULTS CONSIDERING VARIOUS TEST CLASSES
Authors:
FUCHS K PABST M ROSSEL T
Citation:
K. Fuchs et al., RESIST - A RECURSIVE TEST PATTERN GENERATION ALGORITHM FOR PATH DELAYFAULTS CONSIDERING VARIOUS TEST CLASSES, IEEE transactions on computer-aided design of integrated circuits and systems, 13(12), 1994, pp. 1550-1562
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