Authors:
RUSSELL PE
STARK TJ
GRIFFIS DP
PHILLIPS JR
JARAUSCH KF
Citation: Pe. Russell et al., CHEMICALLY AND GEOMETRICALLY ENHANCED FOCUSED ION-BEAM MICROMACHINING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2494-2498
Citation: Kf. Jarausch et al., SILICON STRUCTURES FOR IN-SITU CHARACTERIZATION OF ATOMIC-FORCE MICROSCOPE PROBE GEOMETRY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3425-3430
Citation: Dm. Thaus et al., DEVELOPMENT OF FOCUSED ION-BEAM MACHINING TECHNIQUES FOR PERMALLOY STRUCTURES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3928-3932
Citation: Tj. Stark et al., CHARACTERIZATION OF RESIST PROFILES USING WATER ENHANCED FOCUSED ION-BEAM MICROMACHINING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3990-3995
Authors:
STARK TJ
SHEDD GM
VITARELLI J
GRIFFIS DP
RUSSELL PE
Citation: Tj. Stark et al., H2O ENHANCED FOCUSED ION-BEAM MICROMACHINING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2565-2569
Authors:
UMEHARA Y
OGISO Y
CHIHARA K
MUKASA K
RUSSELL PE
Citation: Y. Umehara et al., METHOD FOR EVALUATING SHARPNESS OF TIP APEX OF A CANTILEVER FOR THE ATOMIC-FORCE MICROSCOPE, Review of scientific instruments, 66(1), 1995, pp. 269-270
Authors:
EDENFELD KM
JARAUSCH KF
STARK TJ
GRIFFIS DP
RUSSELL PE
Citation: Km. Edenfeld et al., FORCE PROBE CHARACTERIZATION USING SILICON 3-DIMENSIONAL STRUCTURES FORMED BY FOCUSED ION-BEAM LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3571-3575
Authors:
KIMBALL JF
ALLEN PE
GRIFFIS DP
RADZIMSKI ZJ
RUSSELL PE
Citation: Jf. Kimball et al., SELECTIVITY VARIATIONS OF ELECTRON-BEAM PATTERNED SILICON DIOXIDE FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2457-2461
Citation: J. Vitarelli et Pe. Russell, TIME-DELAY MEASUREMENTS USING CONVENTIONAL E-BEAM TECHNOLOGY, Microelectronic engineering, 24(1-4), 1994, pp. 221-232
Authors:
VELU EMT
LAMBETH DN
THORNTON JT
RUSSELL PE
Citation: Emt. Velu et al., AFM STRUCTURE AND MEDIA NOISE OF SMCO CR THIN-FILMS AND HARD DISKS/, Journal of applied physics, 75(10), 1994, pp. 6132-6134
Authors:
STARK TJ
EDENFELD KM
GRIFFIS DP
RADZIMSKI ZJ
RUSSELL PE
Citation: Tj. Stark et al., PROXIMITY EFFECTS IN LOW-ENERGY ELECTRON-BEAM LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2367-2372
Citation: Pe. Russell, VENI-VIDI-VICI - SOME 15TH-CENTURY EYEWITNESS ACCOUNTS OF TRAVEL IN THE AFRICAN ATLANTIC BEFORE 1492, Historical research, 66(160), 1993, pp. 115-128