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Results:
1-8
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Results: 8
Authors:
Street, SC
Rar, A
Zhou, JN
Liu, WJ
Barnard, JA
Citation: Sc. Street et al., Unique structural and mechanical properties of ultrathin au films grown ondendrimer-mediated substrates, CHEM MATER, 13(10), 2001, pp. 3669-3677
Authors:
Hofmann, S
Rar, A
Moon, DW
Yoshihara, K
Citation: S. Hofmann et al., Quantitative comparison between Auger electron spectroscopy and secondary ion mass spectroscopy depth profiles of a double layer structure of AlAs inGaAs using the mixing-roughness-information depth model, J VAC SCI A, 19(4), 2001, pp. 1111-1115
Authors:
Rar, A
Zhou, JN
Liu, WJ
Barnard, JA
Bennett, A
Street, SC
Citation: A. Rar et al., Dendrimer-mediated growth of very flat ultrathin Au films, APPL SURF S, 175, 2001, pp. 134-139
Authors:
Liu, WJ
Zhou, JN
Rar, A
Barnard, JA
Citation: Wj. Liu et al., X-ray reflectivity and nanotribological study of deposition-energy-dependent thin CNx overcoats on CoCr magnetic films, APPL PHYS L, 78(10), 2001, pp. 1427-1429
Authors:
Rar, A
Yoshitake, M
Citation: A. Rar et M. Yoshitake, Reduction and removal of thin Al oxide film from Cu substrate by focused electron beam, JPN J A P 1, 39(7B), 2000, pp. 4464-4468
Authors:
Zhou, JN
Rar, A
Otte, D
Barnard, JA
Citation: Jn. Zhou et al., Adhesion at a granular surface, J APPL PHYS, 88(4), 2000, pp. 1880-1885
Authors:
Rar, A
Hofmann, S
Yoshihara, K
Kajiwara, K
Citation: A. Rar et al., Optimization of depth resolution parameters in AES sputter profiling of GaAs AlAs multilayer structures, APPL SURF S, 145, 1999, pp. 310-314
Authors:
Rar, A
Kojima, I
Moon, DW
Hofmann, S
Citation: A. Rar et al., Original and sputtering induced interface roughness in AES sputter depth profiling of SiO2/Ta2O5 multilayers, THIN SOL FI, 356, 1999, pp. 390-394
Risultati:
1-8
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