Authors: Kaczer, B Degraeve, R De Keersgieter, A Rasras, M Groeseneken, G

Citation: B. Kaczer et al., Explanation of nMOSFET substrate current after hard gate oxide breakdown, MICROEL ENG, 59(1-4), 2001, pp. 155-160

Authors: De Wolf, I Rasras, M

Citation: I. De Wolf et M. Rasras, Spectroscopic photon emission microscopy: a unique tool for failure analysis of microelectronics devices, MICROEL REL, 41(8), 2001, pp. 1161-1169

Authors: Rasras, M De Wolf, I Groeseneken, G Kaczer, B Degraeve, R Maes, HE

Citation: M. Rasras et al., Photo-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in thin oxides, IEEE DEVICE, 48(2), 2001, pp. 231-238

Authors: Russ, C Bock, K Rasras, M De Wolf, I Groeseneken, G Maes, HE

Citation: C. Russ et al., Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing, MICROEL REL, 39(11), 1999, pp. 1551-1561