Authors: Rasulev, UK Khasanov, U Palitcin, VV

Citation: Uk. Rasulev et al., Surface-ionization methods and devices of indication and identification ofnitrogen-containing base molecules, J CHROMAT A, 896(1-2), 2000, pp. 3-18

Authors: Belykh, SF Habets, B Rasulev, UK Samartsev, AV Stroev, LV Veryovkin, IV

Citation: Sf. Belykh et al., Relative yields, mass distributions and energy spectra of cluster ions sputtered from niobium under keV atomic and polyatomic gold ion bombardment, NUCL INST B, 164, 2000, pp. 809-819

Authors: Belykh, SF Rasulev, UK Samartsev, AV Stroev, LV Zinoviev, AV

Citation: Sf. Belykh et al., High non-additive sputtering of silicon as large positive cluster ions under polyatomic ion bombardment, VACUUM, 56(4), 2000, pp. 257-262

Authors: Kurnaev, VA Martynenko, YV Panasyuk, MI Pismennyi, VD Rasulev, UK Romanovskii, EA Ryzhov, YA Sadovnichii, VA Tulinov, AF

Citation: Va. Kurnaev et al., In memory of Vladimir Aleksandrovich Molchanov, USP FIZ NAU, 170(4), 2000, pp. 469-470

Authors: Wu, C Hill, HH Rasulev, UK Nazarov, EG

Citation: C. Wu et al., Surface ionization ion mobility spectrometry, ANALYT CHEM, 71(1), 1999, pp. 273-278