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Citation: Og. Schmidt et al., Strain and band-edge alignment in single and multiple layers of self-assembled Ge/Si and GeSi/Si islands, PHYS REV B, 62(24), 2000, pp. 16715-16720

Authors: Eberl, K Schmidt, OG Duschl, R Kienzle, O Ernst, E Rau, Y

Citation: K. Eberl et al., Self-assembling SiGe and SiGeC nanostructures for light emitters and tunneling diodes, THIN SOL FI, 369(1-2), 2000, pp. 33-38