Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-2
|
Results: 2
High-resolution defect detection and noise reduction using wavelet methodsfor surface measurement
Authors:
Recknagel, RJ Kowarschik, R Notni, G
Citation:
Rj. Recknagel et al., High-resolution defect detection and noise reduction using wavelet methodsfor surface measurement, J OPT A-P A, 2(6), 2000, pp. 538-545
High resolution topometry in conjunction with macro structures
Authors:
Duparre, A Notni, G Recknagel, RJ Feigl, T Gliech, S
Citation:
A. Duparre et al., High resolution topometry in conjunction with macro structures, TEC MES, 66(11), 1999, pp. 437-446
Risultati:
1-2
|