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Citation: Aj. Reddy et al., In situ detection of trace levels of copper in hydrofluoric acid, J ELCHEM SO, 147(6), 2000, pp. 2337-2339

Authors: Reddy, AJ Chan, JV Burr, TA Mo, R Wade, CP Chidsey, CED Michel, J Kimerling, LC

Citation: Aj. Reddy et al., Defect states at silicon surfaces, PHYSICA B, 274, 1999, pp. 468-472