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Results: 1-3 |
Results: 3
Relevance of contact reliability in HBM-ESD test equipment
Authors: Reiner, JC Keller, T
Citation: Jc. Reiner et T. Keller, Relevance of contact reliability in HBM-ESD test equipment, MICROEL REL, 41(9-10), 2001, pp. 1397-1401
Impact of ESD-induced sort drain junction damage on CMOS product lifetime
Authors: Reiner, JC Keller, T Jaggi, H Mira, S
Citation: Jc. Reiner et al., Impact of ESD-induced sort drain junction damage on CMOS product lifetime, MICROEL REL, 40(8-10), 2000, pp. 1619-1628
Wafer mapping of ESD performance
Authors: Reiner, JC Schroder, HU Bender, M
Citation: Jc. Reiner et al., Wafer mapping of ESD performance, MICROEL REL, 39(6-7), 1999, pp. 845-850
Risultati: 1-3 |