Authors: Reinicke, D Muller, F de Masi, R Steiner, P Hufner, S

Citation: D. Reinicke et al., Comparison of MEED- and XPD-angular patterns from the Cu(001)-surface, J ELEC SPEC, 114, 2001, pp. 461-470

Authors: Muller, F de Masi, R Steiner, P Reinicke, D Stadtfeld, M Hufner, S

Citation: F. Muller et al., EELS investigation of thin epitaxial NiO/Ag(001) films: surface states in the multilayer, monolayer and submonolayer range, SURF SCI, 459(1-2), 2000, pp. 161-172

Authors: Alvarez, MAV Zampieri, G Reinicke, D Muller, F Steiner, P Hufner, S

Citation: Mav. Alvarez et al., Diffraction effects in the incident and exit paths of electrons backscattered from Cu(001) at medium energies, PHYS REV B, 60(7), 1999, pp. 4952-4960

Authors: Muller, F Steiner, P Straub, T Reinicke, D Palm, S de Masi, R Hufner, S

Citation: F. Muller et al., Full hemispherical intensity maps of crystal field transitions in NiO(001)by angular resolved electron energy loss spectroscopy, SURF SCI, 442(3), 1999, pp. 485-497