Authors: Chaudhuri, J Ignatiev, C Stepanov, S Tsvetkov, D Cherenkov, A Dmitriev, V Rek, Z

Citation: J. Chaudhuri et al., High quality GaN layers grown by hydride vapor phase epitaxy - a high resolution X-ray diffractometry and synchrotron X-ray topography study, MAT SCI E B, 78(1), 2000, pp. 22-27

Authors: Chaudhuri, J Ignatiev, K Edgar, JH Xie, ZY Gao, Y Rek, Z

Citation: J. Chaudhuri et al., Low temperature chemical vapor deposition of 3C-SiC on 6H-SiC - high resolution X-ray diffractometry and synchrotron X-ray topography study, MAT SCI E B, 76(3), 2000, pp. 217-224

Authors: Perko, J Sarler, B Rek, Z

Citation: J. Perko et al., Convergence study of dual reciprocity BEM for Navier-Stokes equations, Z ANG MA ME, 80, 2000, pp. S839-S840

Authors: Rek, Z Sarler, B

Citation: Z. Rek et B. Sarler, Analytical integration of elliptic 2D fundamental solution and its derivatives for straight-line elements with constant interpolation, ENG ANAL, 23(5-6), 1999, pp. 515-525