ACNP - Italian Periodicals Catalogue

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Results: 1-9 |

Results: 9

High pressure synthesis of an iodine doped silicon clathrate compound

Authors: Reny, E Yamanaka, S Cros, C Pouchard, M

Citation: E. Reny et al., High pressure synthesis of an iodine doped silicon clathrate compound, CHEM COMMUN, (24), 2000, pp. 2505-2506

Peierls or Jahn-Teller effect in endohedrally doped silicon clathrates: AnEXAFS study

Authors: Brunet, F Melinon, P San Miguel, A Keghelian, P Perez, A Flank, AM Reny, E Cros, C Pouchard, M

Citation: F. Brunet et al., Peierls or Jahn-Teller effect in endohedrally doped silicon clathrates: AnEXAFS study, PHYS REV B, 61(24), 2000, pp. 16550-16560

Pressure-induced structural phase transitions in Ln(2-x)Nd(x)CuO(4) for Ln= La (0.6 <= x <= 2) and Ln = Pr (x=0)

Authors: Wilhelm, H Cros, C Reny, E Demazeau, G Hanfland, M

Citation: H. Wilhelm et al., Pressure-induced structural phase transitions in Ln(2-x)Nd(x)CuO(4) for Ln= La (0.6 <= x <= 2) and Ln = Pr (x=0), J SOL ST CH, 151(2), 2000, pp. 231-240

Gruneisen parameters for silicon clathrates determined by Raman scattering

Authors: Guyot, Y Grosvalet, L Champagnon, B Reny, E Cros, C Pouchard, M

Citation: Y. Guyot et al., Gruneisen parameters for silicon clathrates determined by Raman scattering, PHYS REV B, 60(21), 1999, pp. 14507-14509

Phonon density of states of silicon clathrates: Characteristic width narrowing effect with respect to the diamond phase

Authors: Melinon, P Keghelian, P Perez, A Champagnon, B Guyot, Y Saviot, L Reny, E Cros, C Pouchard, M Dianoux, AJ

Citation: P. Melinon et al., Phonon density of states of silicon clathrates: Characteristic width narrowing effect with respect to the diamond phase, PHYS REV B, 59(15), 1999, pp. 10099-10104

High pressure behavior of silicon clathrates: A new class of low compressibility materials

Authors: San-Miguel, A Keghelian, P Blase, X Melinon, P Perez, A Itie, JP Polian, A Reny, E Cros, C Pouchard, M

Citation: A. San-miguel et al., High pressure behavior of silicon clathrates: A new class of low compressibility materials, PHYS REV L, 83(25), 1999, pp. 5290-5293

Influence of pressure on the crystal structure of Nd2CuO4

Authors: Wilhelm, H Cros, C Reny, E Demazeau, G Hanfland, M

Citation: H. Wilhelm et al., Influence of pressure on the crystal structure of Nd2CuO4, J MAT CHEM, 8(12), 1998, pp. 2729-2732

Structural characterisations of the NaxSi136 and Na8Si46 silicon clathrates using the Rietveld method

Authors: Reny, E Gravereau, P Cros, C Pouchard, M

Citation: E. Reny et al., Structural characterisations of the NaxSi136 and Na8Si46 silicon clathrates using the Rietveld method, J MAT CHEM, 8(12), 1998, pp. 2839-2844

Electronic signature of the pentagonal rings in silicon clathrate phases: Comparison with cluster-assembled films

Authors: Melinon, P Keghelian, P Blase, X Le Brusc, J Perez, A Reny, E Cros, C Pouchard, M

Citation: P. Melinon et al., Electronic signature of the pentagonal rings in silicon clathrate phases: Comparison with cluster-assembled films, PHYS REV B, 58(19), 1998, pp. 12590-12593

Risultati: 1-9 |