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Results: 1-11 |
Results: 11

Authors: Meltzer, S Resch, R Koel, BE Thompson, ME Madhukar, A Requicha, AAG Will, P
Citation: S. Meltzer et al., Fabrication of nanostructures by hydroxylamine seeding of gold nanoparticle templates, LANGMUIR, 17(5), 2001, pp. 1713-1718

Authors: Resch, R Meltzer, S Vallant, T Hoffmann, H Koel, BE Madhukar, A Requicha, AAG Will, P
Citation: R. Resch et al., Immobilizing Au nanoparticles on SiO2 surfaces using octadecylsiloxane monolayers, LANGMUIR, 17(18), 2001, pp. 5666-5670

Authors: Wang, KS Resch, R Dunn, K Shuler, P Tang, YC Koel, BE Yen, TF
Citation: Ks. Wang et al., Scanning force microscopy study of etch pits formed during dissolution of a barite (001) surface in CDTA and EDTA solutions, LANGMUIR, 16(2), 2000, pp. 649-655

Authors: Resch, R Lewis, D Meltzer, S Montoya, N Koel, BE Madhukar, A Requicha, AAG Will, P
Citation: R. Resch et al., Manipulation of gold nanoparticles in liquid environments using scanning force microscopy, ULTRAMICROS, 82(1-4), 2000, pp. 135-139

Authors: Utriainen, M Lattu, H Viirola, H Niinisto, L Resch, R Friedbacher, G
Citation: M. Utriainen et al., Atomic force microscopy studies of SnO2 thin film microstructures deposited by atomic layer epitaxy, MIKROCH ACT, 133(1-4), 2000, pp. 119-123

Authors: Kanniainen, T Lindroos, S Resch, R Leskela, M Friedbacher, G Grasserbauer, M
Citation: T. Kanniainen et al., Structural and topographical studies of SILAR-grown highly oriented PbS thin films, MATER RES B, 35(7), 2000, pp. 1045-1051

Authors: Resch, R Baur, C Bugacov, A Koel, BE Echternach, PM Madhukar, A Montoya, N Requicha, AAG Will, P
Citation: R. Resch et al., Linking and manipulation of gold multinanoparticle structures using dithiols and scanning force microscopy, J PHYS CH B, 103(18), 1999, pp. 3647-3650

Authors: Wang, KS Resch, R Dunn, K Shuler, P Tang, YC Koel, BE Yen, TF
Citation: Ks. Wang et al., Dissolution of the barite (001) surface by the chelating agent DTPA as studied with non-contact atomic force microscopy, COLL SURF A, 160(3), 1999, pp. 217-227

Authors: Resch, R Grasserbauer, M Friedbacher, G Vallant, T Brunner, H Mayer, U Hoffmann, H
Citation: R. Resch et al., In situ and ex situ AFM investigation of the formation of octadecylsiloxane monolayers, APPL SURF S, 140(1-2), 1999, pp. 168-175

Authors: Wang, KS Resch, R Koel, BE Shuler, PJ Tang, YC Chen, HJ Yen, TF
Citation: Ks. Wang et al., Study of the dissolution of the barium sulfate (001) surface with hydrochloric acid by atomic force microscopy, J COLL I SC, 219(1), 1999, pp. 212-215

Authors: Baur, C Bugacov, A Koel, BE Madhukar, A Montoya, N Ramachandran, TR Requicha, AAG Resch, R Will, P
Citation: C. Baur et al., Nanoparticle manipulation by mechanical pushing: underlying phenomena and real-time monitoring, NANOTECHNOL, 9(4), 1998, pp. 360-364
Risultati: 1-11 |