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Results:
1-10
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Results: 10
Authors:
Kocka, J
Fejfar, A
Fojtik, P
Luterova, K
Pelant, I
Rezek, B
Stuchlikova, H
Stuchlik, J
Svrcek, V
Citation: J. Kocka et al., Charge transport in microcrystalline Si - the specific features, SOL EN MAT, 66(1-4), 2001, pp. 61-71
Transport anisotropy in microcrystalline silicon studied by measurement ofambipolar diffusion length
Authors:
Svrcek, V
Pelant, I
Kocka, J
Fojtik, P
Rezek, B
Stuchlikova, H
Fejfar, A
Stuchlik, J
Poruba, A
Tousek, J
Citation: V. Svrcek et al., Transport anisotropy in microcrystalline silicon studied by measurement ofambipolar diffusion length, J APPL PHYS, 89(3), 2001, pp. 1800-1805
Authors:
Fejfar, A
Rezek, B
Knapek, P
Stuchlik, J
Kocka, J
Citation: A. Fejfar et al., Local electronic transport in microcrystalline silicon observed by combined atomic force microscopy, J NON-CRYST, 266, 2000, pp. 309-314
Authors:
Rezek, B
Nebel, CE
Stutzmann, M
Citation: B. Rezek et al., Local photoconductivity correlation with granular structure of microcrystalline silicon thin films, J NON-CRYST, 266, 2000, pp. 315-318
Authors:
Rezek, B
Nebel, CE
Stutzmann, M
Citation: B. Rezek et al., Interference laser crystallization of microcrystalline silicon using asymmetric beam intensities, J NON-CRYST, 266, 2000, pp. 650-653
Authors:
Rezek, B
Nebel, CE
Stutzmann, M
Citation: B. Rezek et al., Polycrystalline silicon thin films produced by interference laser crystallization of amorphous silicon, JPN J A P 2, 38(10A), 1999, pp. L1083-L1084
Authors:
Zybill, CE
Boubekeur, H
Radojkovic, P
Schwartzkopff, M
Hartmann, E
Koch, F
Groos, G
Rezek, B
Bruchhaus, R
Wersing, W
Citation: Ce. Zybill et al., Direct observation of single domains in poled (111) PZT (PbZr0.25Ti0.75O3)films, SURF SCI, 440(1-2), 1999, pp. 221-230
Authors:
Rezek, B
Nebel, CE
Stutzmann, M
Citation: B. Rezek et al., Correlation of photoconductivity and structure of microcrystalline siliconthin films with submicron resolution, APPL PHYS L, 75(12), 1999, pp. 1742-1744
Authors:
Rezek, B
Stuchlik, J
Fejfar, A
Kocka, J
Citation: B. Rezek et al., Local characterization of electronic transport in microcrystalline siliconthin films with submicron resolution, APPL PHYS L, 74(10), 1999, pp. 1475-1477
Authors:
Rezek, B
Stuchlik, J
Fejfar, A
Kocka, J
Nebel, CE
Stutzmann, M
Citation: B. Rezek et al., Characterization of laser patterned a-Si : H thin films by combined AFM local current measurements, PHYS ST S-A, 170(1), 1998, pp. R1-R2
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