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Citation: D. Ohlmann et al., X-ray diffraction analysis and RHEED images of thin epitaxial GaN films deposited on Al2O3 (0001) by reactive laser ablation, J PHYS IV, 10(P10), 2000, pp. 275-280

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Citation: Ea. Mastio et al., The effects of KrF pulsed laser and thermal annealing on the crystallinityand surface morphology of radiofrequency magnetron sputtered ZnS : Mn thinfilms deposited on Si, J APPL PHYS, 86(5), 1999, pp. 2562-2570

Authors: Deiss, JL Loison, JL Ohlmann, D Robino, M Ulhaq-Bouillet, C Versini, G

Citation: Jl. Deiss et al., Structural and morphological characterization of thin epitaxial Cd1-xZnxTedeposit on GaAs(001), J PHYS IV, 8(P5), 1998, pp. 257-262