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Results: 1-8 |
Results: 8
Synchrotron X-ray microprobe analysis of radioactive trace elements in mineral sands
Authors: Garrett, RF Blagojevic, N Cai, Z Lai, B Legnini, DG Rodrigues, W Stampfl, APJ
Citation: Rf. Garrett et al., Synchrotron X-ray microprobe analysis of radioactive trace elements in mineral sands, NUCL INST A, 467, 2001, pp. 897-900
X-ray scattering studies of surfactant mediated epitaxial growth of Si/Ge/Si(001) heterostructures
Authors: Rodrigues, W Sakata, O Lee, TL Walko, DA Marasco, DL Bedzyk, MJ
Citation: W. Rodrigues et al., X-ray scattering studies of surfactant mediated epitaxial growth of Si/Ge/Si(001) heterostructures, J APPL PHYS, 88(5), 2000, pp. 2391-2394
X-ray microdiffraction study of Cu interconnects
Authors: Zhang, X Solak, H Cerrina, F Lai, B Cai, Z Ilinski, P Legnini, D Rodrigues, W
Citation: X. Zhang et al., X-ray microdiffraction study of Cu interconnects, APPL PHYS L, 76(3), 2000, pp. 315-317
Using zone plates for X-ray microimaging and microspectroscopy in environmental science
Authors: Kemner, KM Yun, W Cai, Z Lai, B Lee, HR Maser, J Legnini, DG Rodrigues, W Jastrow, JD Miller, RM Pratt, ST Schneegurt, MA Kulpa, CF
Citation: Km. Kemner et al., Using zone plates for X-ray microimaging and microspectroscopy in environmental science, J SYNCHROTR, 6, 1999, pp. 639-641
X-ray microdiffraction studies to measure strain fields in a metal matrix composite
Authors: Lee, HR Kupperman, D Yun, W Cai, Z Rodrigues, W
Citation: Hr. Lee et al., X-ray microdiffraction studies to measure strain fields in a metal matrix composite, REV SCI INS, 70(1), 1999, pp. 175-177
Measurement of strain in Al-Cu interconnect lines with x-ray microdiffraction
Authors: Solak, HH Vladimirsky, Y Cerrina, F Lai, B Yun, W Cai, Z Ilinski, P Legnini, D Rodrigues, W
Citation: Hh. Solak et al., Measurement of strain in Al-Cu interconnect lines with x-ray microdiffraction, J APPL PHYS, 86(2), 1999, pp. 884-890
Synchrotron x-ray microdiffraction diagnostics of multilayer optoelectronic devices
Authors: Cai, ZH Rodrigues, W Ilinski, P Legnini, D Lai, B Yun, W Isaacs, ED Lutterodt, KE Grenko, J Glew, R Sputz, S Vandenberg, J People, R Alam, MA Hybertsen, M Ketelsen, LJP
Citation: Zh. Cai et al., Synchrotron x-ray microdiffraction diagnostics of multilayer optoelectronic devices, APPL PHYS L, 75(1), 1999, pp. 100-102
X-ray imaging and microspectroscopy of plants and fungi
Authors: Yun, W Pratt, ST Miller, RM Cai, Z Hunter, DB Jarstfer, AG Kemner, KM Lai, B Lee, HR Legnini, DG Rodrigues, W Smith, CI
Citation: W. Yun et al., X-ray imaging and microspectroscopy of plants and fungi, J SYNCHROTR, 5, 1998, pp. 1390-1395
Risultati: 1-8 |