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Results: 1-18 |
Results: 18

Authors: Peeters, F Pintelon, R Schoukens, J Rolain, Y Gutierrez, ES Guillaume, P
Citation: F. Peeters et al., Identification of rotor-bearing systems in the frequency domain part I: Estimation of frequency response functions, MECH SYST S, 15(4), 2001, pp. 759-773

Authors: Peeters, F Pintelon, R Schoukens, J Rolain, Y
Citation: F. Peeters et al., Identification of rotor-bearing systems in the frequency domain part II: Estimation of modal parameters, MECH SYST S, 15(4), 2001, pp. 775-788

Authors: Van Moer, W Rolain, Y Pintelon, R
Citation: W. Van Moer et al., Modeling in the presence of switching uncertainties, IEEE INSTR, 50(5), 2001, pp. 1103-1108

Authors: Vargha, B Schoukens, J Rolain, Y
Citation: B. Vargha et al., Static nonlinearity testing of digital-to-analog converters, IEEE INSTR, 50(5), 2001, pp. 1283-1288

Authors: Vandersteen, G Rolain, Y Schoukens, J
Citation: G. Vandersteen et al., An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions, IEEE INSTR, 50(5), 2001, pp. 1355-1363

Authors: Pintelon, R Schoukens, J Van Moer, W Rolain, Y
Citation: R. Pintelon et al., Identification of linear systems in the presence of nonlinear distortions, IEEE INSTR, 50(4), 2001, pp. 855-863

Authors: Rolain, Y Van Moer, W Vandersteen, G van Heijningen, M
Citation: Y. Rolain et al., Measuring mixed-signal substrate coupling, IEEE INSTR, 50(4), 2001, pp. 959-964

Authors: Geens, A Rolain, Y
Citation: A. Geens et Y. Rolain, Noise figure measurements on nonlinear devices, IEEE INSTR, 50(4), 2001, pp. 971-975

Authors: Vuerinckx, R Pintelon, R Schoukens, J Rolain, Y
Citation: R. Vuerinckx et al., Obtaining accurate confidence regions for the estimated zeros and poles system identification problems, IEEE AUTO C, 46(4), 2001, pp. 656-659

Authors: Schoukens, J Pintelon, R Rolain, Y Dobrowiecki, T
Citation: J. Schoukens et al., Frequency response function measurements in the presence of nonlinear distortions, AUTOMATICA, 37(6), 2001, pp. 939-946

Authors: Schoukens, J Rolain, Y Swevers, J De Cuyper, J
Citation: J. Schoukens et al., Simple methods and insights to deal with non-linear distortions in FRF-measurements, MECH SYST S, 14(4), 2000, pp. 657-666

Authors: Pintelon, R Schoukens, J Rolain, Y
Citation: R. Pintelon et al., Box-Jenkins continuous-time modeling, AUTOMATICA, 36(7), 2000, pp. 983-991

Authors: Vael, P Rolain, Y
Citation: P. Vael et Y. Rolain, A controllable phase coherent pulsed RF signal generator for microwave network analyzer measurements, IEEE MICR T, 47(12), 1999, pp. 2605-2612

Authors: Pintelon, R Schoukens, J Vandersteen, G Rolain, Y
Citation: R. Pintelon et al., Identification of invariants of (over)parameterized models: Finite sample results, IEEE AUTO C, 44(5), 1999, pp. 1073-1077

Authors: Rolain, Y Pintelon, R
Citation: Y. Rolain et R. Pintelon, Generating robust starting values for frequency-domain transfer function estimation, AUTOMATICA, 35(5), 1999, pp. 965-972

Authors: Schoukens, J Pintelon, R Rolain, Y
Citation: J. Schoukens et al., Study of conditional ML estimators in time and frequency-domain system identification, AUTOMATICA, 35(1), 1999, pp. 91-100

Authors: Rolain, Y Schoukens, J Vandersteen, G
Citation: Y. Rolain et al., Signal reconstruction for non-equidistant finite length sample sets: A "KIS" approach, IEEE INSTR, 47(5), 1998, pp. 1046-1052

Authors: Vael, P Rolain, Y Barel, ARF Bliki, A
Citation: P. Vael et al., Measurements of harmonic distortion produced by a saturated optical amplifier with a nonlinear microwave network analyzer, IEEE INSTR, 47(5), 1998, pp. 1300-1306
Risultati: 1-18 |