Authors:
Rolland, L
Vallee, C
Peignon, MC
Cardinaud, C
Citation: L. Rolland et al., Roughness and chemistry of silicon and polysilicon surfaces etched in high-density plasma: XPS, AFM and ellipsometry analysis, APPL SURF S, 164, 2000, pp. 147-155
Authors:
Rolland, L
Peignon, MC
Cardinaud, C
Turban, G
Citation: L. Rolland et al., SiO2/Si selectivity in high density CHF3/CH4 plasmas: Role of the fluorocarbon layer, MICROEL ENG, 53(1-4), 2000, pp. 375-379
Authors:
Grenier, S
Baylac, MO
Rolland, L
Burnage, R
Arenou, F
Briot, D
Delmas, F
Duflot, M
Genty, V
Gomez, AE
Halbwachs, JL
Marouard, M
Oblak, E
Sellier, A
Citation: S. Grenier et al., Radial velocities IX. Measurements of 2800 B2-F5 stars for Hipparcos, ASTR AST SS, 137(3), 1999, pp. 451-456