Citation: Y. Khlifi et al., Modeling of current-voltage characteristics of metal/ultra-thin oxide/semiconductor structures, EPJ-APPL PH, 9(3), 2000, pp. 239-246
Citation: Y. Khlifi et al., Fowler-Nordheim current oscillations analysis of metal/ultra-thin oxide/semiconductor structures, PHYS ST S-A, 182(2), 2000, pp. 737-753
Citation: A. Sali et al., The effect of a strong magnetic field on the binding energy and the photoionization cross-section in a quantum well, J PHYS-COND, 11(11), 1999, pp. 2427-2436
Authors:
Aouame, K
Destombes, V
Brunet, H
Galy, J
Guillot, P
Roubi, L
Citation: K. Aouame et al., Spectroscopic and kinetic analysis of the krypton VUV continuum in neon-krypton mixtures, J PHYS B, 31(22), 1998, pp. 4929-4941