AAAAAA

   
Results: 1-2 |
Results: 2

Authors: Ermolieff, A Chabli, A Pierre, F Rolland, G Rouchon, D Vannuffel, C Vergnaud, C Baylet, J Semeria, MN
Citation: A. Ermolieff et al., XPS, Raman spectroscopy, X-ray diffraction, specular X-ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization, SURF INT AN, 31(3), 2001, pp. 185-190

Authors: Rannou, P Rouchon, D Nicolau, YF Nechtschein, M Ermolieff, A
Citation: P. Rannou et al., Chemical degradation of aged CSA-protonated PANI films analyzed by XPS, SYNTH METAL, 101(1-3), 1999, pp. 823-824
Risultati: 1-2 |