Authors:
Ermolieff, A
Chabli, A
Pierre, F
Rolland, G
Rouchon, D
Vannuffel, C
Vergnaud, C
Baylet, J
Semeria, MN
Citation: A. Ermolieff et al., XPS, Raman spectroscopy, X-ray diffraction, specular X-ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization, SURF INT AN, 31(3), 2001, pp. 185-190