Authors: Royet, AS Ouisse, T Cabon, B Noblanc, O Arnodo, C Brylinski, C

Citation: As. Royet et al., Self-heating effects in silicon carbide MESFETs, IEEE DEVICE, 47(11), 2000, pp. 2221-2227

Authors: Royet, AS Ouisse, T Billon, T Jaussaud, C Cabon, B

Citation: As. Royet et al., Electrical noise used as a tool for assessing the defectivity of SiC Schottky diodes, MAT SCI E B, 61-2, 1999, pp. 402-405