Authors:
Amenyah, W
Schiavone, P
Ru, CQ
Mioduchowski, A
Citation: W. Amenyah et al., Interior cracking of a circular inclusion with imperfect interface under thermal loading, MATH MECH S, 6(5), 2001, pp. 525-540
Authors:
Shen, H
Schiavone, P
Ru, CQ
Mioduchowski, A
Citation: H. Shen et al., Effects of a compliant interphase layer on internal thermal stresses within an elliptic inhomogeneity in an elastic medium, Z ANG MATH, 52(2), 2001, pp. 317-341
Authors:
Sudak, LJ
Ru, CQ
Schiavone, P
Mioduchowski, A
Citation: Lj. Sudak et al., A circular inclusion with circumferentially inhomogeneous non-slip interface in plane elasticity, Q J MECH AP, 54, 2001, pp. 449-468
Citation: Cq. Ru, Discussion: "Common errors on mapping of nonelliptic curves in anisotropicelasticity" ( Ting, T. C. T., 2000, ASME J. Appl. Mech., 67, pp. 655-657), J APPL MECH, 68(4), 2001, pp. 687-687
Authors:
Shen, H
Schiavone, P
Ru, CQ
Mioduchowski, A
Citation: H. Shen et al., Interfacial thermal stress analysis of an elliptic inclusion with a compliant interphase layer in plane elasticity, INT J SOL S, 38(42-43), 2001, pp. 7587-7606
Authors:
Liu, Y
Ru, CQ
Schiavone, P
Mioduchowski, A
Citation: Y. Liu et al., New phenomena concerning the effect of imperfect bonding on radial matrix cracking in fiber composites, INT J ENG S, 39(18), 2001, pp. 2033-2050
Authors:
Shen, H
Schiavone, P
Ru, CQ
Mioduchowski, A
Citation: H. Shen et al., Analysis of internal stress in an elliptic inclusion with imperfect interface in plane elasticity, MATH MECH S, 5(4), 2000, pp. 501-521
Citation: P. Schiavone et Cq. Ru, The traction problem in a theory of plane strain elasticity with boundary reinforcement, MATH MECH S, 5(1), 2000, pp. 101-115
Citation: Cq. Ru, Exact solution for finite electrode layers embedded at the interface of two piezoelectric half-planes, J MECH PHYS, 48(4), 2000, pp. 693-708
Citation: Cq. Ru, Thermomigration as a driving force for instability of electromigration induced mass transport in interconnect lines, J MATER SCI, 35(22), 2000, pp. 5575-5579
Citation: Cq. Ru, Intrinsic instability of electromigration induced mass transport in a two-dimensional conductor, ACT MATER, 47(13), 1999, pp. 3571-3578