Citation: T. Rudenko et al., A simple method for the evaluation of the recombination parameters in SiC MOS structures, MICROEL ENG, 48(1-4), 1999, pp. 273-276
Authors:
Ernst, T
Cristoloveanu, S
Vandooren, A
Rudenko, T
Colinge, JP
Citation: T. Ernst et al., Recombination current modeling and carrier lifetime extraction in dual-gate fully-depleted SOI devices, IEEE DEVICE, 46(7), 1999, pp. 1503-1509