Authors: Rudenko, T Sveinbjornsson, E Sadeghi, M

Citation: T. Rudenko et al., A simple method for the evaluation of the recombination parameters in SiC MOS structures, MICROEL ENG, 48(1-4), 1999, pp. 273-276

Authors: Ernst, T Cristoloveanu, S Vandooren, A Rudenko, T Colinge, JP

Citation: T. Ernst et al., Recombination current modeling and carrier lifetime extraction in dual-gate fully-depleted SOI devices, IEEE DEVICE, 46(7), 1999, pp. 1503-1509