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Results:
1-8
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Results: 8
Authors:
Alippi, P
Colombo, L
Ruggerone, P
Citation: P. Alippi et al., Energetics and diffusivity of atomic boron in silicon by density-functional-based tight-binding simulations, COMP MAT SC, 22(1-2), 2001, pp. 44-48
Authors:
Fiorentini, V
Meloni, F
Ruggerone, P
Citation: V. Fiorentini et al., Selected papers of the Ninth International Workshop on Computational Materials Science - Villasimius, Sardinia, Italy - 10-13 September, 1999 - Preface, COMP MAT SC, 20(3-4), 2001, pp. VII-VII
Authors:
Alippi, P
Colombo, L
Ruggerone, P
Sieck, A
Seifert, G
Frauenheim, T
Citation: P. Alippi et al., Atomic-scale characterization of boron diffusion in silicon - art. no. 075207, PHYS REV B, 6407(7), 2001, pp. 5207
Authors:
Zoroddu, A
Bernardini, F
Ruggerone, P
Fiorentini, V
Citation: A. Zoroddu et al., First-principles prediction of structure, energetics, formation enthalpy, elastic constants, polarization, and piezoelectric constants of AlN, GaN, and InN: Comparison of local and gradient-corrected density-functional theory - art. no. 045208, PHYS REV B, 6404(4), 2001, pp. 5208
Authors:
Trudu, F
Fiorentini, V
Ruggerone, P
Hansen, U
Citation: F. Trudu et al., Roughening of close-packed singular surfaces - art. no. 153402, PHYS REV B, 6315(15), 2001, pp. 3402
Authors:
Jacobi, K
Platen, J
Setzer, C
Marquez, J
Geelhaar, L
Meyne, C
Richter, W
Kley, A
Ruggerone, P
Scheffler, M
Citation: K. Jacobi et al., Morphology, surface core-level shifts and surface energy of the faceted GaAs(112)A and(112)B surfaces, SURF SCI, 439(1-3), 1999, pp. 59-72
Authors:
Geelhaar, L
Marquez, J
Jacobi, K
Kley, A
Ruggerone, P
Scheffler, M
Citation: L. Geelhaar et al., A scanning tunneling microscopy study of the GaAs(112) surfaces, MICROELEC J, 30(4-5), 1999, pp. 393-396
Authors:
Platen, J
Kley, A
Setzer, C
Jacobi, K
Ruggerone, P
Scheffler, M
Citation: J. Platen et al., The importance of high-index surfaces for the morphology of GaAs quantum dots, J APPL PHYS, 85(7), 1999, pp. 3597-3601
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