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Results: 1-4 |
Results: 4
Simultaneous thickness and refractive index determination of monolayers deposited on an aqueous subphase by null ellipsometry
Authors: Ducharme, D Tessier, A Russev, SC
Citation: D. Ducharme et al., Simultaneous thickness and refractive index determination of monolayers deposited on an aqueous subphase by null ellipsometry, LANGMUIR, 17(24), 2001, pp. 7529-7534
Analytical determination of the optical constants of a substrate in the presence of a covering layer by use of ellipsometric data
Authors: Russev, SC Boyanov, MI Drolet, JP Leblanc, RM
Citation: Sc. Russev et al., Analytical determination of the optical constants of a substrate in the presence of a covering layer by use of ellipsometric data, J OPT SOC A, 16(6), 1999, pp. 1496-1500
Representation of the transparent layer-arbitrary substrate system parameters through the Fourier coefficients of the ellipsometric function
Authors: Russev, SC
Citation: Sc. Russev, Representation of the transparent layer-arbitrary substrate system parameters through the Fourier coefficients of the ellipsometric function, J OPT SOC A, 16(2), 1999, pp. 364-370
Rotating analyzer-fixed analyzer ellipsometer based on null type ellipsometer
Authors: Russev, SC Arguirov, TV
Citation: Sc. Russev et Tv. Arguirov, Rotating analyzer-fixed analyzer ellipsometer based on null type ellipsometer, REV SCI INS, 70(7), 1999, pp. 3077-3082
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