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Results: 1-11 |
Results: 11
TRACE ANALYSIS OF GLASSES BY MAGNETICALLY ENHANCED RF GDMS
Authors: SAPRYKIN AI BECKER JS DIETZE HJ
Citation: Ai. Saprykin et al., TRACE ANALYSIS OF GLASSES BY MAGNETICALLY ENHANCED RF GDMS, Fresenius' journal of analytical chemistry, 359(4-5), 1997, pp. 449-453
DEPTH PROFILING ANALYSIS OF THICK NI-DOPED AND CO-DOPED OXIDE LAYERS ON CR-BASED ALLOYS OF THE INTERCONNECTOR OF A SOLID OXIDE FUEL-CELL USING RF-GDMS
Authors: SAPRYKIN AI BECKER JS VONDERCRONE U DIETZE HJ
Citation: Ai. Saprykin et al., DEPTH PROFILING ANALYSIS OF THICK NI-DOPED AND CO-DOPED OXIDE LAYERS ON CR-BASED ALLOYS OF THE INTERCONNECTOR OF A SOLID OXIDE FUEL-CELL USING RF-GDMS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 145-147
ANALYSIS OF GAAS USING A COMBINED RF GLOW-DISCHARGE AND INDUCTIVELY-COUPLED PLASMA SOURCE-MASS SPECTROMETER
Authors: BECKER JS SAPRYKIN AI DIETZE HJ
Citation: Js. Becker et al., ANALYSIS OF GAAS USING A COMBINED RF GLOW-DISCHARGE AND INDUCTIVELY-COUPLED PLASMA SOURCE-MASS SPECTROMETER, International journal of mass spectrometry and ion processes, 164(1-2), 1997, pp. 81-91
ANALYSIS OF SEMICONDUCTING MATERIALS BY HIGH-RESOLUTION RADIOFREQUENCY GLOW-DISCHARGE MASS-SPECTROMETRY
Authors: JAGER R SAPRYKIN AI BECKER JS DIETZE HJ BROEKAERT JAC
Citation: R. Jager et al., ANALYSIS OF SEMICONDUCTING MATERIALS BY HIGH-RESOLUTION RADIOFREQUENCY GLOW-DISCHARGE MASS-SPECTROMETRY, Mikrochimica acta, 125(1-4), 1997, pp. 41-44
MASS-SPECTROMETRIC ANALYSIS OF CERAMIC COMPONENTS FOR SOLID OXIDE FUEL-CELLS
Authors: BECKER JS WESTHEIDE J SAPRYKIN AI HOLZBRECHER H BREUER U DIETZE HJ
Citation: Js. Becker et al., MASS-SPECTROMETRIC ANALYSIS OF CERAMIC COMPONENTS FOR SOLID OXIDE FUEL-CELLS, Mikrochimica acta, 125(1-4), 1997, pp. 153-160
OPTIMIZATION OF AN RF-POWERED MAGNETRON GLOW-DISCHARGE FOR THE TRACE ANALYSIS OF GLASSES AND CERAMICS
Authors: SAPRYKIN AI BECKER JS DIETZE HJ
Citation: Ai. Saprykin et al., OPTIMIZATION OF AN RF-POWERED MAGNETRON GLOW-DISCHARGE FOR THE TRACE ANALYSIS OF GLASSES AND CERAMICS, Fresenius' journal of analytical chemistry, 355(7-8), 1996, pp. 831-835
TRACE AND SURFACE-ANALYSIS OF CERAMIC LAYERS OF SOLID OXIDE FUEL-CELLS BY MASS-SPECTROMETRY
Authors: BECKER JS BREUER U WESTHEIDE J SAPRYKIN AI HOLZBRECHER H NICKEL H DIETZE HJ
Citation: Js. Becker et al., TRACE AND SURFACE-ANALYSIS OF CERAMIC LAYERS OF SOLID OXIDE FUEL-CELLS BY MASS-SPECTROMETRY, Fresenius' journal of analytical chemistry, 355(5-6), 1996, pp. 626-632
MASS-SPECTROMETRIC AND THEORETICAL INVESTIGATIONS INTO THE FORMATION OF ARGON MOLECULAR-IONS IN PLASMA-MASS SPECTROMETRY
Authors: BECKER JS SEIFERT G SAPRYKIN AI DIETZE HJ
Citation: Js. Becker et al., MASS-SPECTROMETRIC AND THEORETICAL INVESTIGATIONS INTO THE FORMATION OF ARGON MOLECULAR-IONS IN PLASMA-MASS SPECTROMETRY, Journal of analytical atomic spectrometry, 11(9), 1996, pp. 643-648
RADIOFREQUENCY GLOW-DISCHARGE ION-SOURCE FOR HIGH-RESOLUTION MASS-SPECTROMETRY
Authors: SAPRYKIN AI MELCHERS FG BECKER JS DIETZE HJ
Citation: Ai. Saprykin et al., RADIOFREQUENCY GLOW-DISCHARGE ION-SOURCE FOR HIGH-RESOLUTION MASS-SPECTROMETRY, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 570-574
CHARACTERIZATION AND OPTIMIZATION OF A RADIOFREQUENCY GLOW-DISCHARGE ION-SOURCE FOR A HIGH-RESOLUTION MASS-SPECTROMETER
Authors: SAPRYKIN AI BECKER JS DIETZE HJ
Citation: Ai. Saprykin et al., CHARACTERIZATION AND OPTIMIZATION OF A RADIOFREQUENCY GLOW-DISCHARGE ION-SOURCE FOR A HIGH-RESOLUTION MASS-SPECTROMETER, Journal of analytical atomic spectrometry, 10(10), 1995, pp. 897-901
EFFECT OF ION FORMATION CONDITIONS ON RELATIVE SENSITIVITY COEFFICIENTS IN SPARK SOURCE-MASS SPECTROMETRY
Authors: SAPRYKIN AI GERASIMOV VA SHELPAKOVA IR
Citation: Ai. Saprykin et al., EFFECT OF ION FORMATION CONDITIONS ON RELATIVE SENSITIVITY COEFFICIENTS IN SPARK SOURCE-MASS SPECTROMETRY, Journal of analytical chemistry, 48(5), 1993, pp. 583-586
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