Authors: EVANS JH DAVIDSON JA SARITAS M VANDINI M QIAN Y PEAKER AR

Citation: Jh. Evans et al., MINORITY AND MAJORITY CARRIER TRAPS ASSOCIATED WITH OXIDATION-INDUCEDSTACKING-FAULTS IN SILICON, Materials science and technology, 11(7), 1995, pp. 696-701

Authors: SARITAS M PEAKER AR

Citation: M. Saritas et Ar. Peaker, DEEP STATES ASSOCIATED WITH OXIDATION-INDUCED STACKING-FAULTS IN RTA RHO-TYPE SILICON BEFORE AND AFTER COPPER DIFFUSION, Solid-state electronics, 38(5), 1995, pp. 1025-1034