Authors: SCHAFFT HA ERHART DL GLADDEN WK

Citation: Ha. Schafft et al., TOWARD A BUILDING-IN RELIABILITY APPROACH, Microelectronics and reliability, 37(1), 1997, pp. 3-18

Authors: MAYO S SCHAFFT HA

Citation: S. Mayo et Ha. Schafft, ELECTRICAL CHARACTERIZATION OF INTEGRATED-CIRCUIT METAL LINE THICKNESS, Solid-state electronics, 38(12), 1995, pp. 1993-2000