TOWARD A BUILDING-IN RELIABILITY APPROACH

Testing-in reliability, as with post-process and life testing, is show n to be no longer a viable response to the aggressive reliability and market-entry demands facing the semiconductor industry. A building-in reliability approach based on identifying and controlling the causes f or reduced reliability is described and compared to the traditional te sting-in reliability approach. Specific examples of a building-in reli ability approach are given. Published by Elsevier Science Ltd