Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-2
|
Results: 2
LARGE-AREA MULTIARC ION-BEAM SOURCE MAIS
Authors:
ENGELKO V GIESE H SCHALK S
Citation:
V. Engelko et al., LARGE-AREA MULTIARC ION-BEAM SOURCE MAIS, IEEE transactions on plasma science, 25(4), 1997, pp. 722-728
HIGHLY SENSITIVE OPTICAL MEASUREMENT TECHNIQUES BASED ON ACOUSTOOPTICDEVICES
Authors:
GASS PA SCHALK S SAMBLES JR
Citation:
Pa. Gass et al., HIGHLY SENSITIVE OPTICAL MEASUREMENT TECHNIQUES BASED ON ACOUSTOOPTICDEVICES, Applied optics, 33(31), 1994, pp. 7501-7510
Risultati:
1-2
|