Authors: SCHEITHAUER U

Citation: U. Scheithauer, EXAMPLES FOR THE IMPROVEMENTS IN AES DEPTH PROFILING OF MULTILAYER THIN-FILM SYSTEMS BY APPLICATION OF FACTOR-ANALYSIS DATA EVALUATION, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 464-467

Authors: SCHEITHAUER U HOSLER W BRUCHHAUS R

Citation: U. Scheithauer et al., COMBINED AES FACTOR ANALYSIS AND RBS INVESTIGATION OF A THERMALLY TREATED PT/TI METALLIZATION ON SIO2/, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 305-307

Authors: SCHEITHAUER U HOSLER W RIEDL G

Citation: U. Scheithauer et al., EVALUATION OF AES DEPTH PROFILES OF THIN-FILM SYSTEMS BY APPLICATION OF NOVEL GRAPHICALLY INTERACTIVE FACTOR-ANALYSIS SOFTWARE, Surface and interface analysis, 20(6), 1993, pp. 519-523