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Results: 1-16 |
Results: 16
PROBING OF MAGNETIC-SURFACES WITH INHERENT MONOLAYER SENSITIVITY BY ION-SCATTERING
Authors: NARMANN A DIRSKA M MANSKE J SCHLEBERGER M
Citation: A. Narmann et al., PROBING OF MAGNETIC-SURFACES WITH INHERENT MONOLAYER SENSITIVITY BY ION-SCATTERING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1212-1217
SPIN-SENSITIVE ELECTRON-CAPTURE INTO EXCITED-STATES AS A PROBE TO INVESTIGATE MAGNETIC-SURFACES
Authors: NARMANN A DIRSKA M MANSKE J LUBINSKI G SCHLEBERGER M HOEKSTRA R
Citation: A. Narmann et al., SPIN-SENSITIVE ELECTRON-CAPTURE INTO EXCITED-STATES AS A PROBE TO INVESTIGATE MAGNETIC-SURFACES, Surface science, 398(1-2), 1998, pp. 84-90
HEAT-INDUCED ANTIFERROMAGNETIC COUPLING IN MULTILAYERS WITH GE SPACERS
Authors: WALSER P SCHLEBERGER M FUCHS P LANDOLT M
Citation: P. Walser et al., HEAT-INDUCED ANTIFERROMAGNETIC COUPLING IN MULTILAYERS WITH GE SPACERS, Physical review letters, 80(10), 1998, pp. 2217-2220
GE GROWTH ON SI(001) STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY PEAKSHAPE-ANALYSIS AND ATOMIC-FORCE MICROSCOPY
Authors: SCHLEBERGER M SIMONSEN AC TOUGAARD S HANSEN JL LARSEN AN
Citation: M. Schleberger et al., GE GROWTH ON SI(001) STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY PEAKSHAPE-ANALYSIS AND ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(6), 1997, pp. 3032-3035
SURFACE MAGNETISM STUDIED BY POLARIZED-LIGHT EMISSION AFTER HE+ SCATTERING
Authors: MANSKE J DIRSKA M LUBINSKI G SCHLEBERGER M NARMANN A HOEKSTRA R
Citation: J. Manske et al., SURFACE MAGNETISM STUDIED BY POLARIZED-LIGHT EMISSION AFTER HE+ SCATTERING, Journal of magnetism and magnetic materials, 168(3), 1997, pp. 249-256
SURFACE MAGNETISM INVESTIGATED BY LOW-ENERGY ION-SCATTERING IN THE GRAZING-INCIDENCE MODE
Authors: NARMANN A SCHLEBERGER M DIRSKA M MANSKE J LUBINSKI G HOEKSTRA R
Citation: A. Narmann et al., SURFACE MAGNETISM INVESTIGATED BY LOW-ENERGY ION-SCATTERING IN THE GRAZING-INCIDENCE MODE, Surface review and letters, 4(5), 1997, pp. 1039-1042
CIRCULARLY-POLARIZED PHOTON-EMISSION SPECTROSCOPY OF KEV IONS SCATTERING OFF (UN-)MAGNETIZED SURFACES
Authors: HOEKSTRA R MANSKE J DIRSKA M LUBINSKI G SCHLEBERGER M NARMANN A
Citation: R. Hoekstra et al., CIRCULARLY-POLARIZED PHOTON-EMISSION SPECTROSCOPY OF KEV IONS SCATTERING OFF (UN-)MAGNETIZED SURFACES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 125(1-4), 1997, pp. 53-58
STRUCTURAL STUDIES OF THE PB(110) SURFACE WITH ISS AND RHEED
Authors: SPELLER S SCHLEBERGER M HEILAND W
Citation: S. Speller et al., STRUCTURAL STUDIES OF THE PB(110) SURFACE WITH ISS AND RHEED, Surface science, 380(1), 1997, pp. 1-8
MEASURING HYSTERESES OF MAGNETIC-SURFACES BY ION-SCATTERING
Authors: SCHLEBERGER M DIRSKA M MANSKE J NARMANN A
Citation: M. Schleberger et al., MEASURING HYSTERESES OF MAGNETIC-SURFACES BY ION-SCATTERING, Applied physics letters, 71(21), 1997, pp. 3156-3158
CHARACTERISTIC DEPTH OF THE EXCITATION-FUNCTION FOR AUGER ELECTRONS IN THE NOBLE-METALS CU, AG AND AU DETERMINED BY INELASTIC BACKGROUND ANALYSIS
Authors: SCHLEBERGER M FUJITA D TOUGAARD S
Citation: M. Schleberger et al., CHARACTERISTIC DEPTH OF THE EXCITATION-FUNCTION FOR AUGER ELECTRONS IN THE NOBLE-METALS CU, AG AND AU DETERMINED BY INELASTIC BACKGROUND ANALYSIS, Journal of electron spectroscopy and related phenomena, 82(3), 1996, pp. 173-178
ESTIMATION OF EXCITATION DEPTH DISTRIBUTION FROM ELECTRON-EXCITED AUGER-SPECTRA OF IRON USING PEAK SHAPE-ANALYSIS
Authors: FUJITA D SCHLEBERGER M TOUGAARD S
Citation: D. Fujita et al., ESTIMATION OF EXCITATION DEPTH DISTRIBUTION FROM ELECTRON-EXCITED AUGER-SPECTRA OF IRON USING PEAK SHAPE-ANALYSIS, Surface and interface analysis, 24(3), 1996, pp. 211-216
EXTRACTION OF DEPTH DISTRIBUTIONS OF ELECTRON-EXCITED AUGER ELECTRONSIN FE, NI AND SI USING INELASTIC PEAK SHAPE-ANALYSIS
Authors: FUJITA D SCHLEBERGER M TOUGAARD S
Citation: D. Fujita et al., EXTRACTION OF DEPTH DISTRIBUTIONS OF ELECTRON-EXCITED AUGER ELECTRONSIN FE, NI AND SI USING INELASTIC PEAK SHAPE-ANALYSIS, Surface science, 358(1-3), 1996, pp. 180-185
NANOSTRUCTURE OF THIN METAL-FILMS ON SILICON(111) INVESTIGATED BY X-RAY PHOTOELECTRON-SPECTROSCOPY - INELASTIC PEAK SHAPE-ANALYSIS
Authors: SCHLEBERGER M FUJITA D SCHARFSCHWERDT C TOUGAARD S
Citation: M. Schleberger et al., NANOSTRUCTURE OF THIN METAL-FILMS ON SILICON(111) INVESTIGATED BY X-RAY PHOTOELECTRON-SPECTROSCOPY - INELASTIC PEAK SHAPE-ANALYSIS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 949-953
GROWTH AND IN-DEPTH DISTRIBUTION OF THIN METAL-FILMS ON SILICON(111) STUDIED BY XPS - INELASTIC PEAK SHAPE-ANALYSIS
Authors: SCHLEBERGER M FUJITA D SCHARFSCHWERDT C TOUGAARD S
Citation: M. Schleberger et al., GROWTH AND IN-DEPTH DISTRIBUTION OF THIN METAL-FILMS ON SILICON(111) STUDIED BY XPS - INELASTIC PEAK SHAPE-ANALYSIS, Surface science, 333, 1995, pp. 942-947
XPS STUDY OF THE SURFACE ENRICHMENT PROCESS OF CARBON ON C-DOPED NI(111) USING INELASTIC BACKGROUND ANALYSIS
Authors: FUJITA D SCHLEBERGER M TOUGAARD S
Citation: D. Fujita et al., XPS STUDY OF THE SURFACE ENRICHMENT PROCESS OF CARBON ON C-DOPED NI(111) USING INELASTIC BACKGROUND ANALYSIS, Surface science, 333, 1995, pp. 343-348
SURFACE CHANNELING EXPERIMENTS ON PB(110)
Authors: SCHLEBERGER M SPELLER S HOFNER C HEILAND W
Citation: M. Schleberger et al., SURFACE CHANNELING EXPERIMENTS ON PB(110), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 90(1-4), 1994, pp. 274-276
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