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Authors: SCHOLTZ JJ SCHMITZ RWA HENDRIKS BHW DEZWART ST
Citation: Jj. Scholtz et al., DESCRIPTION OF THE INFLUENCE OF CHARGING ON THE MEASUREMENT OF THE SECONDARY-ELECTRON YIELD OF MGO, Applied surface science, 111, 1997, pp. 259-264

Authors: SCHOLTZ JJ DIJKKAMP D SCHMITZ RWA
Citation: Jj. Scholtz et al., SECONDARY-ELECTRON EMISSION PROPERTIES, Philips journal of research, 50(3-4), 1996, pp. 375-389
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