Authors:
SCHENKEL T
BARNES AV
HAMZA AV
SCHNEIDER DH
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Authors:
SCHENKEL T
HAMZA AV
BARNES AV
SCHNEIDER DH
WALSH DS
DOYLE BL
Citation: T. Schenkel et al., ANALYSIS OF B-SIO2 FILMS BY HIGHLY-CHARGED ION BASED TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY, STANDARD SECONDARY-ION MASS-SPECTROMETRY AND ELASTIC RECOIL DETECTION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1384-1387
Authors:
SCHENKEL T
HAMZA AV
BARNES AV
SCHNEIDER DH
BANKS JC
DOYLE BL
Citation: T. Schenkel et al., ABLATION OF GAAS BY INTENSE, ULTRAFAST ELECTRONIC EXCITATION FROM HIGHLY-CHARGED IONS, Physical review letters, 81(12), 1998, pp. 2590-2593
Authors:
SCHENKEL T
BARNES AV
HAMZA AV
SCHNEIDER DH
BANKS JC
DOYLE BL
Citation: T. Schenkel et al., SYNERGY OF ELECTRONIC EXCITATIONS AND ELASTIC COLLISION SPIKES IN SPUTTERING OF HEAVY-METAL OXIDES, Physical review letters, 80(19), 1998, pp. 4325-4328
Authors:
SCHENKEL T
BARNES AV
BRIERE MA
HAMZA A
VONWITTENAU AS
SCHNEIDER DH
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Authors:
SCHENKEL T
BRIERE MA
SCHMIDTBOCKING H
BETHGE K
SCHNEIDER DH
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Authors:
BRIAND JP
DEBILLY L
JIN J
KHEMLICHE H
PRIOR MH
XIE Z
NECTOUX M
SCHNEIDER DH
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Authors:
SCHNEIDER DH
BRIERE MA
MCDONALD J
BIERSACK J
Citation: Dh. Schneider et al., ION SURFACE INTERACTION STUDIES WITH 1-3 KEV AMU IONS UP TO TH80+/, Radiation effects and defects in solids, 127(2), 1993, pp. 113-136
Authors:
CLARK MW
SCHNEIDER DH
DEVENEY EF
KESSEL QC
POLLACK E
SMITH WW
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