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Results: 1
DETAILED INVESTIGATION OF SEM-RESULTS BY TEM AT ONE SAMPLE USING FIB-TECHNIQUE
Authors:
MUHLE U WIESNER A SCHRAY S
Citation:
U. Muhle et al., DETAILED INVESTIGATION OF SEM-RESULTS BY TEM AT ONE SAMPLE USING FIB-TECHNIQUE, Microelectronics and reliability, 38(6-8), 1998, pp. 895-899
Risultati:
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