Citation: R. Schrimpf, SELECTED PAPERS FROM THE 1995 EEE-NUCLEAR-AND-SPACE-RADIATION-EFFECTS-CONFERENCE (NSREC-95) - MADISON, WISCONSIN, JULY 17-21, 1995, IEEE transactions on nuclear science, 42(6), 1995, pp. 1532-1532
Authors:
TITUS JL
WHEATLEY CF
BURTON DI
MOURET I
ALLENSPACH M
BREWS J
SCHRIMPF R
GALLOWAY K
PEASE RL
Citation: Jl. Titus et al., IMPACT OF OXIDE THICKNESS ON SEGR FAILURE IN VERTICAL POWERMOSFETS - DEVELOPMENT OF A SEMIEMPIRICAL EXPRESSION, IEEE transactions on nuclear science, 42(6), 1995, pp. 1928-1934