Citation: L. Tapfer et al., DOUBLE-CRYSTAL AND TRIPLE-CRYSTAL X-RAY-DIFFRACTION ANALYSIS OF SEMICONDUCTOR QUANTUM WIRES, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 179-183
Authors:
CINGOLANI R
RINALDI R
CALCAGNILE L
PRETE P
SCIACOVELLI P
TAPFER L
VANZETTI L
MULA G
BASSANI F
SORBA L
FRANCIOSI A
Citation: R. Cingolani et al., RECOMBINATION MECHANISMS AND LASING IN SHALLOW ZN0.9CD0.1SE ZNSE QUANTUM-WELL STRUCTURES/, Physical review. B, Condensed matter, 49(23), 1994, pp. 16769-16772
Citation: L. Decaro et al., DOUBLE-CRYSTAL X-RAY-DIFFRACTION FROM PERIODICALLY CORRUGATED CRYSTALLINE SEMICONDUCTOR SURFACES, Applied physics letters, 64(1), 1994, pp. 34-36