Authors: LAHMAR A HMINA N SCUDELLER Y BARDON JP

Citation: A. Lahmar et al., CORRELATION BETWEEN THE ADHESION AND THE THERMAL CONTACT RESISTANCE -EFFECTS OF SUBSTRATE SURFACE ION-BOMBARDMENT ETCHING, Thin solid films, 325(1-2), 1998, pp. 156-162

Authors: HMINA N SCUDELLER Y

Citation: N. Hmina et Y. Scudeller, THERMAL INTERFACE RESISTANCE AND SUBSURFACE EFFUSIVITY OF SUBMICRON METALLIC-FILMS ON DIELECTRIC SUBSTRATES - AN EXPERIMENTAL-METHOD FOR SIMULTANEOUS DETERMINATION, International journal of heat and mass transfer, 41(18), 1998, pp. 2781-2798

Authors: LEPALUDIER V SCUDELLER Y

Citation: V. Lepaludier et Y. Scudeller, SIMULTANEOUS DETERMINATION OF THE THERMAL-DIFFUSIVITY OF SEMICONDUCTOR-LASERS AND RESISTANCE OF THEIR ADHESIVE JOINTS, International journal of heat and mass transfer, 41(11), 1998, pp. 1585-1599

Authors: LEPALUDIER V SCUDELLER Y

Citation: V. Lepaludier et Y. Scudeller, A TRANSIENT METHOD OF THERMAL CHARACTERIZATION OF DOUBLE-HETEROSTRUCTURE LASER-DIODES, Microelectronics, 28(3), 1997, pp. 301-312

Authors: HMINA N SCUDELLER Y

Citation: N. Hmina et Y. Scudeller, EXPERIMENTAL-METHOD FOR THERMAL CONTACT R ESISTANCE MEASUREMENT OF A SUBMICRONIC FILM ON A SUBSTRATE, Journal de physique. III, 5(6), 1995, pp. 881-901

Authors: LAHMAR A SCUDELLER Y DANES F BARDON JP

Citation: A. Lahmar et al., X-RAY PHOTOELECTRON-SPECTROSCOPY ANALYSIS OF THERMAL AND PLASMA-TREATED STEEL SUBSTRATES AND THEIR INTERFACE FORMED WITH AN ALUMINUM LAYER, Thin solid films, 266(1), 1995, pp. 58-61