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Results: 26-33/33
Authors:
SEAH MP
QIU JH
CUMPSON PJ
CASTLE JE
Citation: Mp. Seah et al., SIMPLE METHOD OF DEPTH PROFILING (STRATIFYING) CONTAMINATION LAYERS, ILLUSTRATED BY STUDIES ON STAINLESS-STEEL, Surface and interface analysis, 21(6-7), 1994, pp. 336-341
Authors:
SEAH MP
QIU JH
CUMPSON PJ
CASTLE JE
Citation: Mp. Seah et al., STABILITY OF REFERENCE MASSES-II - THE EFFECT OF ENVIRONMENT AND CLEANING METHODS ON THE SURFACES OF STAINLESS-STEEL AND ALLIED MATERIALS, Metrologia, 31(2), 1994, pp. 93-108
Authors:
CUMPSON PJ
SEAH MP
Citation: Pj. Cumpson et Mp. Seah, STABILITY OF REFERENCE MASSES .1. EVIDENCE FOR POSSIBLE VARIATIONS INTHE MASS OF REFERENCE KILOGRAMS ARISING FROM MERCURY CONTAMINATION, Metrologia, 31(1), 1994, pp. 21-26
Authors:
SEAH MP
Citation: Mp. Seah, AES AND XPS MEASUREMENTS - REDUCING THE UNCERTAINTY AND IMPROVING THEACCURACY, Applied surface science, 70-1, 1993, pp. 1-8
Authors:
LASER D
SEAH MP
Citation: D. Laser et Mp. Seah, REASSESSMENT OF ENERGY TRANSFERS IN THE QUASI-ELASTIC SCATTERING OF 250-3000 EV ELECTRONS AT SURFACES, Physical review. B, Condensed matter, 47(15), 1993, pp. 9836-9839
SCATTERING IN ELECTRON SPECTROMETERS, DIAGNOSIS AND AVOIDANCE .1. CONCENTRIC HEMISPHERICAL ANALYZERS
Authors:
SEAH MP
Citation: Mp. Seah, SCATTERING IN ELECTRON SPECTROMETERS, DIAGNOSIS AND AVOIDANCE .1. CONCENTRIC HEMISPHERICAL ANALYZERS, Surface and interface analysis, 20(11), 1993, pp. 865-875
Authors:
SEAH MP
Citation: Mp. Seah, SCATTERING IN ELECTRON SPECTROMETERS, DIAGNOSIS AND AVOIDANCE .2. CYLINDRICAL MIRROR ANALYZERS, Surface and interface analysis, 20(11), 1993, pp. 876-890
Authors:
SEAH MP
TOSA M
Citation: Mp. Seah et M. Tosa, LINEARITY IN ELECTRON COUNTING AND DETECTION SYSTEMS, Surface and interface analysis, 18(3), 1992, pp. 240-246